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Journal: CrystalsVolume: 11Number: 160
Article: Structural and Electronic Properties of Polycrystalline InAs Thin Films Deposited on Silicon Dioxide and Glass at Temperatures below 500 °C
  • Authors:
  • Anya Curran1,2,*,
  • Agnieszka Gocalinska1 and
  • Andrea Pescaglini1
  • et al.
Link: https://www.mdpi.com/2073-4352/11/2/160

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