Article Versions Notes

Fröjdh E, Wennmacher JTC, Rzepka P, Mozzanica A, Redford S, Schmitt B, van Bokhoven JA, Gruene T. Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector. Crystals. 2020; 10(12):1148. https://doi.org/10.3390/cryst10121148

Fröjdh, Erik, Julian T. C. Wennmacher, Przemyslaw Rzepka, Aldo Mozzanica, Sophie Redford, Bernd Schmitt, Jeroen A. van Bokhoven, and Tim Gruene. 2020. "Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector" Crystals 10, no. 12: 1148. https://doi.org/10.3390/cryst10121148

Fröjdh, E., Wennmacher, J. T. C., Rzepka, P., Mozzanica, A., Redford, S., Schmitt, B., van Bokhoven, J. A., & Gruene, T. (2020). Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector. Crystals, 10(12), 1148. https://doi.org/10.3390/cryst10121148