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Journal: MicromachinesVolume: 16Number: 27
Article: Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors
  • Authors:
  • Snežana Djorić-Veljković1,*,
  • Emilija Živanović2,* and
  • Vojkan Davidović2
  • et al.
Link: https://www.mdpi.com/2072-666X/16/1/27

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