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Journal: MicromachinesVolume: 13Number: 748
Article: Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode
- Authors:
- Haitao Zhang1,2,
- Xuanwu Kang1,* and
- Yingkui Zheng1
- et al.
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