Djorić-Veljković, S.; Živanović, E.; Davidović, V.; Veljković, S.; Mitrović, N.; Ristić, G.; Paskaleva, A.; Spassov, D.; Danković, D.
Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors. Micromachines 2025, 16, 27.
https://doi.org/10.3390/mi16010027
AMA Style
Djorić-Veljković S, Živanović E, Davidović V, Veljković S, Mitrović N, Ristić G, Paskaleva A, Spassov D, Danković D.
Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors. Micromachines. 2025; 16(1):27.
https://doi.org/10.3390/mi16010027
Chicago/Turabian Style
Djorić-Veljković, Snežana, Emilija Živanović, Vojkan Davidović, Sandra Veljković, Nikola Mitrović, Goran Ristić, Albena Paskaleva, Dencho Spassov, and Danijel Danković.
2025. "Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors" Micromachines 16, no. 1: 27.
https://doi.org/10.3390/mi16010027
APA Style
Djorić-Veljković, S., Živanović, E., Davidović, V., Veljković, S., Mitrović, N., Ristić, G., Paskaleva, A., Spassov, D., & Danković, D.
(2025). Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors. Micromachines, 16(1), 27.
https://doi.org/10.3390/mi16010027
