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Journal: MicromachinesVolume: 15Number: 503
Article: A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress
  • Authors:
  • Emilija Živanović1,
  • Sandra Veljković1 and
  • Nikola Mitrović1
  • et al.
Link: https://www.mdpi.com/2072-666X/15/4/503

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