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Journal: Micromachines, 2024
Volume: 15
Number: 503
503
Article: A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress
Authors: by Emilija Živanović, Sandra Veljković, Nikola Mitrović, Igor Jovanović, Snežana Djorić-Veljković, Albena Paskaleva, Dencho Spassov and Danijel Danković
Link: https://www.mdpi.com/2072-666X/15/4/503

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