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Journal: Micromachines, 2024
Volume: 15
Number: 1292
Article:
Impact of Total Ionizing Dose on Radio Frequency Performance of 22 nm Fully Depleted Silicon-On-Insulator nMOSFETs
Authors:
by
Zhanpeng Yan, Hongxia Liu, Menghao Huang, Shulong Wang, Shupeng Chen, Xilong Zhou, Junjie Huang and Chang Liu
Link:
https://www.mdpi.com/2072-666X/15/11/1292
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