Tang, Z.; Li, C.; You, H.; Liu, X.; Wang, Y.; Dai, Y.; Bai, G.; Lin, X.
Logical Resolving-Based Methodology for Efficient Reliability Analysis. Micromachines 2024, 15, 85.
https://doi.org/10.3390/mi15010085
AMA Style
Tang Z, Li C, You H, Liu X, Wang Y, Dai Y, Bai G, Lin X.
Logical Resolving-Based Methodology for Efficient Reliability Analysis. Micromachines. 2024; 15(1):85.
https://doi.org/10.3390/mi15010085
Chicago/Turabian Style
Tang, Zhengguang, Cong Li, Hailong You, Xingming Liu, Yu Wang, Yong Dai, Geng Bai, and Xiaoling Lin.
2024. "Logical Resolving-Based Methodology for Efficient Reliability Analysis" Micromachines 15, no. 1: 85.
https://doi.org/10.3390/mi15010085
APA Style
Tang, Z., Li, C., You, H., Liu, X., Wang, Y., Dai, Y., Bai, G., & Lin, X.
(2024). Logical Resolving-Based Methodology for Efficient Reliability Analysis. Micromachines, 15(1), 85.
https://doi.org/10.3390/mi15010085