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Journal: Micromachines, 2024
Volume: 15
Number: 46

Article: Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges
Authors: by Haode Li, Jiangtao Su, Ruijin Wang, Zhenyu Liu and Mengmeng Xu
Link: https://www.mdpi.com/2072-666X/15/1/46

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