Su, W.-H.; Zhang, J.; Yang, C.; Page, R.; Szinyei, T.; Hirsch, C.D.; Steffenson, B.J.
Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sens. 2021, 13, 26.
https://doi.org/10.3390/rs13010026
AMA Style
Su W-H, Zhang J, Yang C, Page R, Szinyei T, Hirsch CD, Steffenson BJ.
Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sensing. 2021; 13(1):26.
https://doi.org/10.3390/rs13010026
Chicago/Turabian Style
Su, Wen-Hao, Jiajing Zhang, Ce Yang, Rae Page, Tamas Szinyei, Cory D. Hirsch, and Brian J. Steffenson.
2021. "Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision" Remote Sensing 13, no. 1: 26.
https://doi.org/10.3390/rs13010026
APA Style
Su, W.-H., Zhang, J., Yang, C., Page, R., Szinyei, T., Hirsch, C. D., & Steffenson, B. J.
(2021). Automatic Evaluation of Wheat Resistance to Fusarium Head Blight Using Dual Mask-RCNN Deep Learning Frameworks in Computer Vision. Remote Sensing, 13(1), 26.
https://doi.org/10.3390/rs13010026