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Journal: Remote Sens., 2020
Volume: 12
Number: 1024

Article: Predicting Wheat Yield at the Field Scale by Combining High-Resolution Sentinel-2 Satellite Imagery and Crop Modelling
Authors: by Yan Zhao, Andries B Potgieter, Miao Zhang, Bingfang Wu and Graeme L Hammer
Link: https://www.mdpi.com/2072-4292/12/6/1024

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