Order Article Reprints

Wu J, Zhao Y, Zhao CZ, Yang L, Lu Q, Zhang Q, Smith J, Zhao Y. Effects of Rapid Thermal Annealing on the Structural, Electrical, and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition. Materials. 2016; 9(8):695. https://doi.org/10.3390/ma9080695

Wu, Jingjin, Yinchao Zhao, Ce Zhou Zhao, Li Yang, Qifeng Lu, Qian Zhang, Jeremy Smith, and Yongming Zhao. 2016. "Effects of Rapid Thermal Annealing on the Structural, Electrical, and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition" Materials 9, no. 8: 695. https://doi.org/10.3390/ma9080695

Wu, J., Zhao, Y., Zhao, C. Z., Yang, L., Lu, Q., Zhang, Q., Smith, J., & Zhao, Y. (2016). Effects of Rapid Thermal Annealing on the Structural, Electrical, and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition. Materials, 9(8), 695. https://doi.org/10.3390/ma9080695