Article Versions Notes

Zdziebko P, Krzemiński M, Okoń M, Loi G, Aymerich F, Pieczonka Ł, Klepka A. An Approach to the Automated Characterization of Out-of-Plane and In-Plane Local Defect Resonances. Materials. 2023; 16(8):3084. https://doi.org/10.3390/ma16083084

Zdziebko, Paweł, Mateusz Krzemiński, Maciej Okoń, Gabriela Loi, Francesco Aymerich, Łukasz Pieczonka, and Andrzej Klepka. 2023. "An Approach to the Automated Characterization of Out-of-Plane and In-Plane Local Defect Resonances" Materials 16, no. 8: 3084. https://doi.org/10.3390/ma16083084

Zdziebko, P., Krzemiński, M., Okoń, M., Loi, G., Aymerich, F., Pieczonka, Ł., & Klepka, A. (2023). An Approach to the Automated Characterization of Out-of-Plane and In-Plane Local Defect Resonances. Materials, 16(8), 3084. https://doi.org/10.3390/ma16083084