Sáfrán, G.; Petrik, P.; Szász, N.; Olasz, D.; Chinh, N.Q.; Serényi, M.
Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases. Materials 2023, 16, 3005.
https://doi.org/10.3390/ma16083005
AMA Style
Sáfrán G, Petrik P, Szász N, Olasz D, Chinh NQ, Serényi M.
Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases. Materials. 2023; 16(8):3005.
https://doi.org/10.3390/ma16083005
Chicago/Turabian Style
Sáfrán, György, Péter Petrik, Noémi Szász, Dániel Olasz, Nguyen Quang Chinh, and Miklós Serényi.
2023. "Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases" Materials 16, no. 8: 3005.
https://doi.org/10.3390/ma16083005
APA Style
Sáfrán, G., Petrik, P., Szász, N., Olasz, D., Chinh, N. Q., & Serényi, M.
(2023). Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases. Materials, 16(8), 3005.
https://doi.org/10.3390/ma16083005