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Journal: MaterialsVolume: 16Number: 6138
Article: Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs
  • Authors:
  • Ki-Yong Shin1,
  • Ju-Won Shin1 and
  • Walid Amir1
  • et al.
Link: https://www.mdpi.com/1996-1944/16/18/6138

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