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Shin K-Y, Shin J-W, Amir W, Chakraborty S, Shim J-P, Lee S-T, Jang H, Shin C-S, Kwon H-M, Kim T-W. Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs. Materials. 2023; 16(18):6138. https://doi.org/10.3390/ma16186138

Shin, Ki-Yong, Ju-Won Shin, Walid Amir, Surajit Chakraborty, Jae-Phil Shim, Sang-Tae Lee, Hyunchul Jang, Chan-Soo Shin, Hyuk-Min Kwon, and Tae-Woo Kim. 2023. "Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs" Materials 16, no. 18: 6138. https://doi.org/10.3390/ma16186138

Shin, K.-Y., Shin, J.-W., Amir, W., Chakraborty, S., Shim, J.-P., Lee, S.-T., Jang, H., Shin, C.-S., Kwon, H.-M., & Kim, T.-W. (2023). Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs. Materials, 16(18), 6138. https://doi.org/10.3390/ma16186138