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Journal: Materials, 2021
Volume: 14
Number: 5472
Article:
Structural Analysis of Low Defect Ammonothermally Grown GaN Wafers by Borrmann Effect X-ray Topography
Authors:
by
Lutz Kirste, Karolina Grabianska, Robert Kucharski, Tomasz Sochacki, Boleslaw Lucznik and Michal Bockowski
Link:
https://www.mdpi.com/1996-1944/14/19/5472
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