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Open AccessArticle

Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications

1
Faculty of Applied Sciences and Engineering, Ovidius University, 900527 Constanţa, Romania
2
Joint Institute of Nuclear Research, Dubna, 141980 Moscow Region, Russia
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Horia Hulubei National Institute for Physics and Nuclear Engineering, 077125 Bucharest, Romania
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Moscow Institute of Physics and Technology, 141701 Dolgoprudny, Russia
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Institute for Safety Problems of Nuclear Power Plants, NAS of Ukraine, 07270 Kyiv, Ukraine
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Donetsk Institute of Physics and Engineering named after O.O. Galkin, 83114 Donetsk, Ukraine
*
Author to whom correspondence should be addressed.
Materials 2020, 13(2), 399; https://doi.org/10.3390/ma13020399
Received: 8 November 2019 / Revised: 16 December 2019 / Accepted: 8 January 2020 / Published: 15 January 2020
Titanium-based composites—titanium and silver (TiAg) and titanium and carbon (TiC)—were synthesized by the Thermionic Vacuum Arc (TVA) method on substrates especially for gear wheels and camshaft coating as mechanical components of irrigation pumps. The films were characterized by surface morphology, microstructure, and roughness through X-ray Diffraction (XRD), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Small-Angle Neutron Scattering (SANS). The silver (Ag) films crystallized into a cubic system with lattice a = 4.0833 Å at room temperature, indexed as cubic Ag group Fm3m. The crystallites were oriented in the [111] direction, and mean grain size was <D>111 = 265 Å. The TiC structure revealed a predominant cubic TiC phase, with a = 0.4098 as a lattice parameter determined by Cohen’s method. Average roughness (Ra) was 8 nm for the as-grown 170 nm thick TiAg film, and 1.8 nm for the as-grown 120 nm thick TiC film. Characteristic SANS contribution was detected from the TiAg layer deposited on a substrate of high-quality stainless steel with 0.45% carbon (OLC45) in the range of 0.015 Å−1 ≤ Q ≤ 0.4 Å−1, revealing the presence of sharp surfaces and an averaged triaxial ellipsoidal core-shell object. View Full-Text
Keywords: Ti-based layers; TVA deposition method; AFM; SEM; TEM; XRD; SANS Ti-based layers; TVA deposition method; AFM; SEM; TEM; XRD; SANS
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Vladoiu, R.; Mandes, A.; Dinca, V.; Balasoiu, M.; Soloviov, D.; Turchenko, V. Synthesis and Characterization of Complex Nanostructured Thin Films Based on Titanium for Industrial Applications. Materials 2020, 13, 399.

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