Bao, Y.; Liu, K.; Wu, X.; Qiu, Z.; Wang, H.; Li, S.; Wang, X.; Zhang, G.
Simulation and Finite Element Analysis of the Electrical Contact Characteristics of Closing Resistors Under Dynamic Closing Impacts. Energies 2025, 18, 4714.
https://doi.org/10.3390/en18174714
AMA Style
Bao Y, Liu K, Wu X, Qiu Z, Wang H, Li S, Wang X, Zhang G.
Simulation and Finite Element Analysis of the Electrical Contact Characteristics of Closing Resistors Under Dynamic Closing Impacts. Energies. 2025; 18(17):4714.
https://doi.org/10.3390/en18174714
Chicago/Turabian Style
Bao, Yanyan, Kang Liu, Xiao Wu, Zicheng Qiu, Hailong Wang, Simeng Li, Xiaofei Wang, and Guangdong Zhang.
2025. "Simulation and Finite Element Analysis of the Electrical Contact Characteristics of Closing Resistors Under Dynamic Closing Impacts" Energies 18, no. 17: 4714.
https://doi.org/10.3390/en18174714
APA Style
Bao, Y., Liu, K., Wu, X., Qiu, Z., Wang, H., Li, S., Wang, X., & Zhang, G.
(2025). Simulation and Finite Element Analysis of the Electrical Contact Characteristics of Closing Resistors Under Dynamic Closing Impacts. Energies, 18(17), 4714.
https://doi.org/10.3390/en18174714
