Sikander, A.; Kelly, S.; Kuchta, K.; Sievers, A.; Willner, T.; Hursthouse, A.S.
Chemical and Microbial Leaching of Valuable Metals from PCBs and Tantalum Capacitors of Spent Mobile Phones. Int. J. Environ. Res. Public Health 2022, 19, 10006.
https://doi.org/10.3390/ijerph191610006
AMA Style
Sikander A, Kelly S, Kuchta K, Sievers A, Willner T, Hursthouse AS.
Chemical and Microbial Leaching of Valuable Metals from PCBs and Tantalum Capacitors of Spent Mobile Phones. International Journal of Environmental Research and Public Health. 2022; 19(16):10006.
https://doi.org/10.3390/ijerph191610006
Chicago/Turabian Style
Sikander, Asma, Steven Kelly, Kerstin Kuchta, Anika Sievers, Thomas Willner, and Andrew S. Hursthouse.
2022. "Chemical and Microbial Leaching of Valuable Metals from PCBs and Tantalum Capacitors of Spent Mobile Phones" International Journal of Environmental Research and Public Health 19, no. 16: 10006.
https://doi.org/10.3390/ijerph191610006
APA Style
Sikander, A., Kelly, S., Kuchta, K., Sievers, A., Willner, T., & Hursthouse, A. S.
(2022). Chemical and Microbial Leaching of Valuable Metals from PCBs and Tantalum Capacitors of Spent Mobile Phones. International Journal of Environmental Research and Public Health, 19(16), 10006.
https://doi.org/10.3390/ijerph191610006