Choi, S.; Yoon, C.; Kim, S.; Kim, W.; Ha, K.; Jeong, J.; Kim, J.; Shin, J.; Park, D.
Comprehensive Evaluation of Hazardous Chemical Exposure Control System at a Semiconductor Manufacturing Company in South Korea. Int. J. Environ. Res. Public Health 2018, 15, 1162.
https://doi.org/10.3390/ijerph15061162
AMA Style
Choi S, Yoon C, Kim S, Kim W, Ha K, Jeong J, Kim J, Shin J, Park D.
Comprehensive Evaluation of Hazardous Chemical Exposure Control System at a Semiconductor Manufacturing Company in South Korea. International Journal of Environmental Research and Public Health. 2018; 15(6):1162.
https://doi.org/10.3390/ijerph15061162
Chicago/Turabian Style
Choi, Sangjun, Chungsik Yoon, Seungwon Kim, Won Kim, Kwonchul Ha, Jeeyeon Jeong, Jongcheul Kim, Jungah Shin, and Donguk Park.
2018. "Comprehensive Evaluation of Hazardous Chemical Exposure Control System at a Semiconductor Manufacturing Company in South Korea" International Journal of Environmental Research and Public Health 15, no. 6: 1162.
https://doi.org/10.3390/ijerph15061162
APA Style
Choi, S., Yoon, C., Kim, S., Kim, W., Ha, K., Jeong, J., Kim, J., Shin, J., & Park, D.
(2018). Comprehensive Evaluation of Hazardous Chemical Exposure Control System at a Semiconductor Manufacturing Company in South Korea. International Journal of Environmental Research and Public Health, 15(6), 1162.
https://doi.org/10.3390/ijerph15061162