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Journal: Sensors, 2025
Volume: 25
Number: 3774

Article: Transverse Electric Inverse Scattering of Conductors Using Artificial Intelligence
Authors: by Chien-Ching Chiu, Po-Hsiang Chen, Yen-Chen Chang and Hao Jiang
Link: https://www.mdpi.com/1424-8220/25/12/3774

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