Delaney, B.; Buntinx, S.; van Elst, D.M.J.; van Klinken, A.; van Veldhoven, R.P.J.; Fiore, A.
Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera. Sensors 2025, 25, 3295.
https://doi.org/10.3390/s25113295
AMA Style
Delaney B, Buntinx S, van Elst DMJ, van Klinken A, van Veldhoven RPJ, Fiore A.
Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera. Sensors. 2025; 25(11):3295.
https://doi.org/10.3390/s25113295
Chicago/Turabian Style
Delaney, Ben, Sjors Buntinx, Don M. J. van Elst, Anne van Klinken, René P. J. van Veldhoven, and Andrea Fiore.
2025. "Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera" Sensors 25, no. 11: 3295.
https://doi.org/10.3390/s25113295
APA Style
Delaney, B., Buntinx, S., van Elst, D. M. J., van Klinken, A., van Veldhoven, R. P. J., & Fiore, A.
(2025). Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera. Sensors, 25(11), 3295.
https://doi.org/10.3390/s25113295