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Journal: Sensors, 2025
Volume: 25
Number: 3157
Article:
Single-Crystal Inspection Using an Adapted Total Focusing Method
Authors:
by
Iratxe Aizpurua-Maestre, Aitor De Miguel, Jose Luis Lanzagorta, Ewen Carcreff and Lander Galdos
Link:
https://www.mdpi.com/1424-8220/25/10/3157
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