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Journal: Sensors, 2024
Volume: 24
Number: 7211
Article:
Intelligent Control System for the Hard X-Ray Nanoprobe Beamline Beam Optimization Based on Automatic Evolution Algorithm and Expert System
Authors:
by
Yuhao Liu, Ying Zhao, Yan He, Zhaohong Zhang and Aiguo Li
Link:
https://www.mdpi.com/1424-8220/24/22/7211
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