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Journal: SensorsVolume: 24Number: 7211
Article: Intelligent Control System for the Hard X-Ray Nanoprobe Beamline Beam Optimization Based on Automatic Evolution Algorithm and Expert System
  • Authors:
  • Yuhao Liu1,2,†,
  • Ying Zhao2,*,† and
  • Yan He2
  • et al.
Link: https://www.mdpi.com/1424-8220/24/22/7211

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