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Journal: Sensors, 2023
Volume: 23
Number: 2265

Article: Effects of Charge Traps on Hysteresis in Organic Field-Effect Transistors and Their Charge Trap Cause Analysis through Causal Inference Techniques
Authors: by Somi Kim, Hochen Yoo and Jaeyoung Choi
Link: https://www.mdpi.com/1424-8220/23/4/2265

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