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Journal: SensorsVolume: 23Number: 5470
Article: Robust Detection, Segmentation, and Metrology of High Bandwidth Memory 3D Scans Using an Improved Semi-Supervised Deep Learning Approach
  • Authors:
  • Jie Wang,
  • Richard Chang* and
  • Ziyuan Zhao
  • et al.
Link: https://www.mdpi.com/1424-8220/23/12/5470

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