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Journal: Sensors, 2022
Volume: 22
Number: 2915

Article: Semi-Supervised Learning for Defect Segmentation with Autoencoder Auxiliary Module
Authors: by Bee-ing Sae-ang, Wuttipong Kumwilaisak and Pakorn Kaewtrakulpong
Link: https://www.mdpi.com/1424-8220/22/8/2915

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