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Journal: SensorsVolume: 22Number: 2915
Article: Semi-Supervised Learning for Defect Segmentation with Autoencoder Auxiliary Module
  • Authors:
  • Bee-ing Sae-ang1,*,
  • Wuttipong Kumwilaisak1,* and
  • Pakorn Kaewtrakulpong2
Link: https://www.mdpi.com/1424-8220/22/8/2915

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