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Journal: SensorsVolume: 22Number: 802
Article: Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
  • Authors:
  • Huachun Wang1,
  • Jingjing Tian2 and
  • Bingwei Lu3
  • et al.
Link: https://www.mdpi.com/1424-8220/22/3/802

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