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Journal: Sensors, 2022
Volume: 22
Number: 802
802
Article: Degradation Study of Thin-Film Silicon Structures in a Cell Culture Medium
Authors: by Huachun Wang, Jingjing Tian, Bingwei Lu, Yang Xie, Pengcheng Sun, Lan Yin, Yuguang Wang and Xing Sheng
Link: https://www.mdpi.com/1424-8220/22/3/802

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