Shu, Y.; Mukherjee, S.; Chang, T.; Gilmore, A.; Tringe, J.W.; Stobbe, D.M.; Loh, K.J.
Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors 2022, 22, 9167.
https://doi.org/10.3390/s22239167
AMA Style
Shu Y, Mukherjee S, Chang T, Gilmore A, Tringe JW, Stobbe DM, Loh KJ.
Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors. 2022; 22(23):9167.
https://doi.org/10.3390/s22239167
Chicago/Turabian Style
Shu, Yening, Saptarshi Mukherjee, Tammy Chang, Abigail Gilmore, Joseph W. Tringe, David M. Stobbe, and Kenneth J. Loh.
2022. "Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography" Sensors 22, no. 23: 9167.
https://doi.org/10.3390/s22239167
APA Style
Shu, Y., Mukherjee, S., Chang, T., Gilmore, A., Tringe, J. W., Stobbe, D. M., & Loh, K. J.
(2022). Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors, 22(23), 9167.
https://doi.org/10.3390/s22239167