Youn, J.; Park, J.; Oh, J.; Kim, S.; Ahn, S.; Cho, S.; Park, S.; You, C.
CeRA-eSP: Code-Expanded Random Access to Enhance Success Probability of Massive MTC. Sensors 2022, 22, 7959.
https://doi.org/10.3390/s22207959
AMA Style
Youn J, Park J, Oh J, Kim S, Ahn S, Cho S, Park S, You C.
CeRA-eSP: Code-Expanded Random Access to Enhance Success Probability of Massive MTC. Sensors. 2022; 22(20):7959.
https://doi.org/10.3390/s22207959
Chicago/Turabian Style
Youn, Jiseung, Joohan Park, Joohyun Oh, Soohyeong Kim, Seyoung Ahn, Sunghyun Cho, Sangwoo Park, and Cheolwoo You.
2022. "CeRA-eSP: Code-Expanded Random Access to Enhance Success Probability of Massive MTC" Sensors 22, no. 20: 7959.
https://doi.org/10.3390/s22207959
APA Style
Youn, J., Park, J., Oh, J., Kim, S., Ahn, S., Cho, S., Park, S., & You, C.
(2022). CeRA-eSP: Code-Expanded Random Access to Enhance Success Probability of Massive MTC. Sensors, 22(20), 7959.
https://doi.org/10.3390/s22207959