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Journal: Sensors, 2022
Volume: 22
Number: 6685

Article: Chip Pad Inspection Method Based on an Improved YOLOv5 Algorithm
Authors: by Jiangjie Xu, Yanli Zou, Yufei Tan and Zichun Yu
Link: https://www.mdpi.com/1424-8220/22/17/6685

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