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Journal: SensorsVolume: 19Number: 3398
Article: An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner
  • Authors:
  • Jianxiong Li1,2,†,
  • Qian Zhou1,2,† and
  • Xinghui Li1,2,*
  • et al.
Link: https://www.mdpi.com/1424-8220/19/15/3398

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