Tian, W.; Liang, X.; Qu, X.; Sun, J.; Gao, S.; Xu, L.; Yang, W.
Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor. Sensors 2019, 19, 3132.
https://doi.org/10.3390/s19143132
AMA Style
Tian W, Liang X, Qu X, Sun J, Gao S, Xu L, Yang W.
Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor. Sensors. 2019; 19(14):3132.
https://doi.org/10.3390/s19143132
Chicago/Turabian Style
Tian, Wenbin, Xiaofeng Liang, Xiaolei Qu, Jiangtao Sun, Shuo Gao, Lijun Xu, and Wuqiang Yang.
2019. "Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor" Sensors 19, no. 14: 3132.
https://doi.org/10.3390/s19143132
APA Style
Tian, W., Liang, X., Qu, X., Sun, J., Gao, S., Xu, L., & Yang, W.
(2019). Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor. Sensors, 19(14), 3132.
https://doi.org/10.3390/s19143132