Order Article Reprints

Zhang T, Wei W, Zhao B, Wang R, Li M, Yang L, Wang J, Sun Q. A Reliable Methodology for Determining Seed Viability by Using Hyperspectral Data from Two Sides of Wheat Seeds. Sensors. 2018; 18(3):813. https://doi.org/10.3390/s18030813

Zhang, Tingting, Wensong Wei, Bin Zhao, Ranran Wang, Mingliu Li, Liming Yang, Jianhua Wang, and Qun Sun. 2018. "A Reliable Methodology for Determining Seed Viability by Using Hyperspectral Data from Two Sides of Wheat Seeds" Sensors 18, no. 3: 813. https://doi.org/10.3390/s18030813

Zhang, T., Wei, W., Zhao, B., Wang, R., Li, M., Yang, L., Wang, J., & Sun, Q. (2018). A Reliable Methodology for Determining Seed Viability by Using Hyperspectral Data from Two Sides of Wheat Seeds. Sensors, 18(3), 813. https://doi.org/10.3390/s18030813