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Journal: Sensors, 2012
Volume: 12
Number: 175
Article:
Development of a Hybrid Atomic Force Microscopic Measurement System Combined with White Light Scanning Interferometry
Authors:
by
Tong Guo, Siming Wang, Dante J. Dorantes-Gonzalez, Jinping Chen, Xing Fu and Xiaotang Hu
Link:
https://www.mdpi.com/1424-8220/12/1/175
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