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Journal: Int. J. Mol. Sci., 2011
Volume: 12
Number: 2200
2200-2215
Article: Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements
Authors: by Pascal Sánchez, Olaya Lorenzo, Armando Menéndez, Jose Luis Menéndez, David Gomez, Rosario Pereiro and Beatriz Fernández
Link: https://www.mdpi.com/1422-0067/12/4/2200

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