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Journal: International Journal of Molecular SciencesVolume: 12Number: 2200
Article: Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements
  • Authors:
  • Pascal Sánchez1,2,†,
  • Olaya Lorenzo3,† and
  • Armando Menéndez2,*
  • et al.
Link: https://www.mdpi.com/1422-0067/12/4/2200

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