Topic Editors

Department of Mechanical and Electromechanical Engineering, Tamkang University, New Taipei City 251301, Taiwan
Department of Mechanical Engineering, Yuan Ze Fuel Cell Center, Yuan Ze University, Taoyuan 320, Taiwan

High-Performance MEMS: Synergy in Design, Innovative Manufacturing, and Emerging Applications

Abstract submission deadline
31 August 2027
Manuscript submission deadline
31 December 2027

Topic Information

Dear Colleagues,

Given the large number of MEMS-specific issues currently being published, what exactly is the focus of this “High-Performance MEMS” Topic? We attempt to propose the following challenging perspectives:

  1. Could MEMS continue to shrink? For advanced silicon-based IC technology with 2 nm or smaller nodes, continued shrinkage is very difficult, but for most MEMS technologies whose sizes are still above 180 nm, there is obviously still plenty of room for shrinkage. How can we narrow the size gap between MEMS and IC fab technology?
  2. Could CMOS MEMS become more popular in the world? There is obviously no difficulty in patterning CMOS MEMS devices using mature commercial IC fab technology, but why are there so few such research attempts? Is it because the foundry service cost is too high? Is there no corresponding 8-inch or 12-inch wafer processing equipment for MEMS post processing? Or is it because of other reasons? Can CMOS MEMS foundry technology freely design and manufacture the geometry of various transducers? What are the limiting barriers?
  3. Regarding the high-performance MEMS, incorporating reliability and field validation metrics is also mandatory. It includes sensitivity, resolution, response time, long-term stability, thermal drift, humidity resistance, chemical corrosion resistance, mechanical fatigue and packaging reliability. It is crucial especially in the areas of semiconductor equipment, battery technology, green energy and smart manufacturing. With the promising ubiquitous sensing data provided by MEMS and the corresponding AI edge computing or digital twin, the traditional data measurement concept could be expanded into a real-time diagnostic and decision support platform for the above application domains.

It is believed that by addressing the above concerns, we can lower the barrier to move forward to the next-generation MEMS devices/systems and naturally nourish more emerging and cross-boundary applications.

This Topic welcomes submissions of innovative related ideas. The paper category is not limited to general articles and reviews, nor is it necessary to complete the component production and testing before submitting. Short letters or tutorials are also welcome. Nevertheless, innovative ideas are always the most valuable.

Prof. Dr. Lung-Jieh Yang
Prof. Dr. Chi-Yuan Lee
Topic Editors

Keywords

  • MEMS
  • CMOS MEMS
  • advanced IC technology
  • ubiquitous sensing
  • MEMS reliability
  • field validation metrics of MEMS

Participating Journals

Journal Name Impact Factor CiteScore Launched Year First Decision (median) APC
Electronics
electronics
2.9 7.0 2012 14.8 Days CHF 2400 Submit
Eng
eng
3.5 4.1 2020 18.8 Days CHF 1400 Submit
Micro
micro
2.4 4.0 2021 20.4 Days CHF 1200 Submit
Micromachines
micromachines
3.5 7.1 2010 16.6 Days CHF 2100 Submit
Sensors
sensors
4.0 9.4 2001 17.8 Days CHF 2600 Submit

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Published Papers

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