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Keywords = VLSI placement

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15 pages, 3975 KB  
Article
Optimization Study for Enhancing Internal Module Communication Efficiency in Integrated Circuits
by Jong-Hyun Seo
Electronics 2025, 14(13), 2661; https://doi.org/10.3390/electronics14132661 - 30 Jun 2025
Viewed by 236
Abstract
In backend VLSI design, congestion and timing are critical factors. However, due to the high complexity of semiconductor design and the specialization required at each design stage, frontend and backend designs are often conducted independently. This can lead to difficulties in achieving overall [...] Read more.
In backend VLSI design, congestion and timing are critical factors. However, due to the high complexity of semiconductor design and the specialization required at each design stage, frontend and backend designs are often conducted independently. This can lead to difficulties in achieving overall optimization of the design. This paper addresses this issue not by solving it comprehensively but by focusing specifically on the communication methods between internal modules of the chip. We analyze cell placement and routing congestion and explore methods to optimize communication efficiency by considering timing issues in advance. Specifically, the study compares and analyzes the efficiency of different methods for selecting target modules by the primary module under various conditions. Focusing on the commonly used Chip Select (CS) and Identification (ID) methods, we examine how each method’s complexity and performance are affected by the number and type of target modules controlled and propose design approaches to optimize module-to-module communication. This paper offers recommendations on module selection methods based on design conditions and provides practical guidelines for designers to enhance communication efficiency effectively. Full article
(This article belongs to the Special Issue Progress and Future Development of Real-Time Systems on Chip)
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14 pages, 2269 KB  
Article
A Deep Reinforcement Learning Floorplanning Algorithm Based on Sequence Pairs
by Shenglu Yu, Shimin Du and Chang Yang
Appl. Sci. 2024, 14(7), 2905; https://doi.org/10.3390/app14072905 - 29 Mar 2024
Cited by 2 | Viewed by 4357
Abstract
In integrated circuit (IC) design, floorplanning is an important stage in obtaining the floorplan of the circuit to be designed. Floorplanning determines the performance, size, yield, and reliability of very large-scale integration circuit (VLSI) ICs. The results obtained in this step are necessary [...] Read more.
In integrated circuit (IC) design, floorplanning is an important stage in obtaining the floorplan of the circuit to be designed. Floorplanning determines the performance, size, yield, and reliability of very large-scale integration circuit (VLSI) ICs. The results obtained in this step are necessary for the subsequent continuous processes of chip design. From a computational perspective, VLSI floorplanning is an NP-hard problem, making it difficult to be efficiently solved by classical optimization techniques. In this paper, we propose a deep reinforcement learning floorplanning algorithm based on sequence pairs (SP) to address the placement problem. Reinforcement learning utilizes an agent to explore the search space in sequence pairs to find the optimal solution. Experimental results on the international standard test circuit benchmarks, MCNC and GSRC, demonstrate that the proposed deep reinforcement learning floorplanning algorithm based on sequence pairs can produce a superior solution. Full article
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23 pages, 8495 KB  
Review
Progress of Placement Optimization for Accelerating VLSI Physical Design
by Yihang Qiu, Yan Xing, Xin Zheng, Peng Gao, Shuting Cai and Xiaoming Xiong
Electronics 2023, 12(2), 337; https://doi.org/10.3390/electronics12020337 - 9 Jan 2023
Cited by 15 | Viewed by 12319
Abstract
Placement is essential in very large-scale integration (VLSI) physical design, as it directly affects the design cycle. Despite extensive prior research on placement, achieving fast and efficient placement remains challenging because of the increasing design complexity. In this paper, we comprehensively review the [...] Read more.
Placement is essential in very large-scale integration (VLSI) physical design, as it directly affects the design cycle. Despite extensive prior research on placement, achieving fast and efficient placement remains challenging because of the increasing design complexity. In this paper, we comprehensively review the progress of placement optimization from the perspective of accelerating VLSI physical design. It can help researchers systematically understand the VLSI placement problem and the corresponding optimization means, thereby advancing modern placement optimization research. We highlight emerging trends in modern placement-centric VLSI physical design flows, including placement optimizers and learning-based predictors. We first define the placement problem and review the classical placement algorithms, then discuss the application bottleneck of the classical placement algorithms in advanced technology nodes and give corresponding solutions. After that, we introduce the development of placement optimizers, including algorithm improvements and computational acceleration, pointing out that these two aspects will jointly promote accelerating VLSI physical design. We also present research working on learning-based predictors from various angles. Finally, we discuss the common and individual challenges encountered by placement optimizers and learning-based predictors. Full article
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25 pages, 1593 KB  
Article
Exploiting On-Chip Voltage Regulators for Leakage Reduction in Hardware Masking
by Soner Seçkiner and Selçuk Köse
Sensors 2022, 22(18), 7028; https://doi.org/10.3390/s22187028 - 16 Sep 2022
Cited by 2 | Viewed by 1928
Abstract
A design space exploration of the countermeasures for hardware masking is proposed in this paper. The assumption of independence among shares used in hardware masking can be violated in practical designs. Recently, the security impact of noise coupling among multiple masking shares has [...] Read more.
A design space exploration of the countermeasures for hardware masking is proposed in this paper. The assumption of independence among shares used in hardware masking can be violated in practical designs. Recently, the security impact of noise coupling among multiple masking shares has been demonstrated both in practical FPGA implementations and with extensive transistor level simulations. Due to the highly sophisticated interactions in modern VLSI circuits, the interactions among multiple masking shares are quite challenging to model and thus information leakage from one share to another through noise coupling is difficult to mitigate. In this paper, the implications of utilizing on-chip voltage regulators to minimize the coupling among multiple masking shares through a shared power delivery network (PDN) are investigated. Specifically, different voltage regulator configurations where the power is delivered to different shares through various configurations are investigated. The placement of a voltage regulator relative to the masking shares is demonstrated to a have a significant impact on the coupling between masking shares. A PDN consisting of two shares is simulated with an ideal voltage regulator, strong DLDO, normal DLDO, weak DLDO, two DLDOs, and two DLDOs with 180 phase shift. An 18 × 18 grid PDN with a normal DLDO is simulated to demonstrate the effect of PDN impedance on security. The security analysis is performed using correlation and t-test analyses where a low correlation between shares can be inferred as security improvement and a t-test value below 4.5 means that the shares have negligible coupling, and thus the proposed method is secure. In certain cases, the proposed techniques achieve up to an 80% reduction in the correlation between masking shares. The PDN with two DLDOs and two-phase DLDO with 180 phase shift achieve satisfactory security levels since t-test values remain under 4.5 with 100,000 traces of simulations. The security of the PDN improves if DLDO is placed closer to any one of the masking shares. Full article
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15 pages, 1758 KB  
Article
Exploiting Net Connectivity in Legalization and Detailed Placement Scenarios
by Antonios Dadaliaris, George Kranas, Panagiotis Oikonomou, George Floros and Michael Dossis
Information 2022, 13(5), 212; https://doi.org/10.3390/info13050212 - 20 Apr 2022
Cited by 1 | Viewed by 3061
Abstract
Standard-cell placement is the fundamental step in a typical VLSI/ASIC design flow. Its result, paired with the outcome of the routing procedure can be the decisive factor in rendering a design manufacturable. Global placement generates an optimized instance of the design targeting a [...] Read more.
Standard-cell placement is the fundamental step in a typical VLSI/ASIC design flow. Its result, paired with the outcome of the routing procedure can be the decisive factor in rendering a design manufacturable. Global placement generates an optimized instance of the design targeting a set of metrics, while ignoring rules pertaining its feasibility. Legalization and detailed placement rectify this situation, attempting to attain minimum quality loss by often disregarding the connectivity between cells and making runtime the focal point of these steps. In this article, we present a set of variations on a connectivity-based legalization scheme that can either be applied as a legalizer or a detailed placer. The variations can be applied in the entirety of the chip area or in the confinement of a user-specified bin while they are guided by various optimization goals, e.g., total wire length, displacement and density. We analytically describe our variations and evaluate them through extensive simulations on commonly used benchmarks. Full article
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22 pages, 1420 KB  
Article
Detailed Placement and Global Routing Co-Optimization with Complex Constraints
by Zhipeng Huang, Haishan Huang, Runming Shi, Xu Li, Xuan Zhang, Weijie Chen, Jiaxiang Wang and Ziran Zhu
Electronics 2022, 11(1), 51; https://doi.org/10.3390/electronics11010051 - 24 Dec 2021
Cited by 10 | Viewed by 4855
Abstract
With several divided stages, placement and routing are the most critical and challenging steps in VLSI physical design. To ensure that physical implementation problems can be manageable and converged in a reasonable runtime, placement/routing problems are usually further split into several sub-problems, which [...] Read more.
With several divided stages, placement and routing are the most critical and challenging steps in VLSI physical design. To ensure that physical implementation problems can be manageable and converged in a reasonable runtime, placement/routing problems are usually further split into several sub-problems, which may cause conservative margin reservation and mis-correlation. Therefore, it is desirable to design an algorithm that can accurately and efficiently consider placement and routing simultaneously. In this paper, we propose a detailed placement and global routing co-optimization algorithm while considering complex routing constraints to avoid conservative margin reservation and mis-correlation in placement/routing stages. Firstly, we present a rapidly preprocessing technology based on R-tree to improve the initial routing results. After that, a BFS-based approximate optimal addressing algorithm in 3D is designed to find a proper destination for cell movement. We propose an optimal region selection algorithm based on the partial routing solution to jump out of the local optimal solution. Further, a fast partial net rip-up and rerouted algorithm is used in the process of cell movement. Finally, we adopt an efficient refinement technique to reduce the routing length further. Compared with the top 3 winners according to the 2020 ICCAD CAD contest benchmarks, the experimental results show that our algorithm achieves the best routing length reduction for all cases with a shorter runtime. On average, our algorithm can improve 0.7%, 1.5%, and 1.7% for the first, second, and third place, respectively. In addition, we can still obtain the best results after relaxing the maximum cell movement constraint, which further illustrates the effectiveness of our algorithm. Full article
(This article belongs to the Section Computer Science & Engineering)
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15 pages, 2215 KB  
Article
A New Physical Design Flow for a Selective State Retention Based Approach
by Joseph Rabinowicz and Shlomo Greenberg
J. Low Power Electron. Appl. 2021, 11(3), 35; https://doi.org/10.3390/jlpea11030035 - 13 Sep 2021
Cited by 4 | Viewed by 4398
Abstract
This research presents a novel approach for physical design implementation aimed for a System on Chip (SoC) based on Selective State Retention techniques. Leakage current has become a dominant factor in Very Large Scale Integration (VLSI) design. Power Gating (PG) techniques were first [...] Read more.
This research presents a novel approach for physical design implementation aimed for a System on Chip (SoC) based on Selective State Retention techniques. Leakage current has become a dominant factor in Very Large Scale Integration (VLSI) design. Power Gating (PG) techniques were first developed to mitigate these leakage currents, but they result in longer SoC wake-up periods due to loss of state. The common State Retention Power Gating (SRPG) approach was developed to overcome the PG technique’s loss of state drawback. However, SRPG resulted in a costly expense of die area overhead due to the additional state retention logic required to keep the design state when power is gated. Moreover, the physical design implementation of SRPG presents additional wiring due to the extra power supply network and power-gating controls for the state retention logic. This results in increased implementation complexity for the physical design tools, and therefore increases runtime and limits the ability to handle large designs. Recently published works on Selective State Retention Power Gating (SSRPG) techniques allow reducing the total amount of retention logic and their leakage currents. Although the SSRPG approach mitigates the overhead area and power limitations of the conventional SRPG technique, still both SRPG and SSRPG approaches require a similar extra power grid network for the retention cells, and the effect of the selective approach on the complexity of the physical design has not been yet investigated. Therefore, this paper introduces further analysis of the physical design flow for the SSRPG design, which is required for optimal cell placement and power grid allocation. This significantly increases the potential routing area, which directly improves the convergence time of the Place and Route tools. Full article
(This article belongs to the Special Issue Low Power Memory/Memristor Devices and Systems)
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18 pages, 985 KB  
Article
Congestion Prediction in FPGA Using Regression Based Learning Methods
by Pingakshya Goswami and Dinesh Bhatia
Electronics 2021, 10(16), 1995; https://doi.org/10.3390/electronics10161995 - 18 Aug 2021
Cited by 13 | Viewed by 4176
Abstract
Design closure in general VLSI physical design flows and FPGA physical design flows is an important and time-consuming problem. Routing itself can consume as much as 70% of the total design time. Accurate congestion estimation during the early stages of the design flow [...] Read more.
Design closure in general VLSI physical design flows and FPGA physical design flows is an important and time-consuming problem. Routing itself can consume as much as 70% of the total design time. Accurate congestion estimation during the early stages of the design flow can help alleviate last-minute routing-related surprises. This paper has described a methodology for a post-placement, machine learning-based routing congestion prediction model for FPGAs. Routing congestion is modeled as a regression problem. We have described the methods for generating training data, feature extractions, training, regression models, validation, and deployment approaches. We have tested our prediction model by using ISPD 2016 FPGA benchmarks. Our prediction method reports a very accurate localized congestion value in each channel around a configurable logic block (CLB). The localized congestion is predicted in both vertical and horizontal directions. We demonstrate the effectiveness of our model on completely unseen designs that are not initially part of the training data set. The generated results show significant improvement in terms of accuracy measured as mean absolute error and prediction time when compared against the latest state-of-the-art works. Full article
(This article belongs to the Special Issue Advanced AI Hardware Designs Based on FPGAs)
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17 pages, 4790 KB  
Article
A Sub-50 µm2, Voltage-Scalable, Digital-Standard-Cell-Compatible Thermal Sensor Frontend for On-Chip Thermal Monitoring
by Seongjong Kim and Mingoo Seok
J. Low Power Electron. Appl. 2018, 8(2), 16; https://doi.org/10.3390/jlpea8020016 - 30 May 2018
Cited by 1 | Viewed by 7709
Abstract
This paper presents an on-chip temperature sensor circuit for dynamic thermal management in VLSI systems. The sensor directly senses the threshold voltage that contains temperature information using a single PMOS device. This simple structure enables the sensor to achieve an ultra-compact footprint. The [...] Read more.
This paper presents an on-chip temperature sensor circuit for dynamic thermal management in VLSI systems. The sensor directly senses the threshold voltage that contains temperature information using a single PMOS device. This simple structure enables the sensor to achieve an ultra-compact footprint. The sensor also exhibits high accuracy and voltage-scalability down to 0.4 V, allowing the sensor to be used in dynamic voltage frequency scaling systems without requiring extra power distribution or regulation. The compact footprint and voltage scalability enables our proposed sensor to be implemented in a digital standard-cell format, allowing aggressive sensor placement very close to target hotspots in digital blocks. The proposed sensor frontend prototyped in a 65 nm CMOS technology has a footprint of 30.1 µm2, 3σ-error of ±1.1 °C across 0 to 100 °C after one temperature point calibration, marking a significant improvement over existing sensors designed for dynamic thermal management in VLSI systems. Full article
(This article belongs to the Special Issue CMOS Low Power Design)
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