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Keywords = SiOx interface

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14 pages, 7287 KB  
Article
The Conversion of Syngas to Long-Chain α-Olefins over Rh-Promoted CoMnOx Catalyst
by Yuting Dai, Xuemin Cao, Fei Qian, Xia Li, Li Zhang, Peng He, Zhi Cao and Chang Song
Catalysts 2025, 15(12), 1122; https://doi.org/10.3390/catal15121122 - 1 Dec 2025
Viewed by 629
Abstract
The direct synthesis of long-chain α-olefins from syngas offers a strategically vital pathway for producing high-value chemicals from alternative carbon resources. However, achieving high selectivity toward C5+ olefins remains challenging due to competing paraffin formation and difficulties in precisely regulating chain growth [...] Read more.
The direct synthesis of long-chain α-olefins from syngas offers a strategically vital pathway for producing high-value chemicals from alternative carbon resources. However, achieving high selectivity toward C5+ olefins remains challenging due to competing paraffin formation and difficulties in precisely regulating chain growth kinetics. To mitigate these critical challenges, a series of Rh-promoted Co-Mn catalysts supported on SiO2 were synthesized using a carbon-mediated impregnation strategy for the direct conversion of syngas to long-chain α-olefins (C5+). The introduction of Rh significantly enhanced both catalytic activity and C5+ olefin selectivity. The optimal 1.1 wt% Rh-loaded catalyst achieved 24.6% CO conversion and 46.0% total olefin selectivity, with 34.2% of the selectivity toward C5+ olefins, while maintaining low CH4 (6.2%) and CO2 (<1%) selectivity. Comprehensive characterization techniques, including XRD, H2-TPR, XPS, and TEM/HAADF-STEM, revealed that the carbon-mediated method facilitated the formation of highly dispersed Co3O4 nanoparticles with abundant oxygen vacancies and strengthened the Co-MnOx interface. Rh promotion modulated the cobalt speciation (Co0/Co2+), improved reducibility, and enhanced the metal-support interaction. This promoted chain growth and olefin desorption while suppressing over-hydrogenation. This study demonstrates the efficacy of Rh promotion and carbon mediation in designing high-performance Fischer-Tropsch catalysts for selective α-olefin synthesis, offering new insights into the design of efficient metal-oxide interfacial catalysts. Full article
(This article belongs to the Special Issue Feature Papers in "Industrial Catalysis" Section, 2nd Edition)
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18 pages, 2653 KB  
Article
Compact Microcontroller-Based LED-Driven Photoelectric System for Accurate Photoresponse Mapping Compatible with Internet of Things
by Bohdan Sus, Alexey Kozynets, Sergii Litvinenko, Alla Ivanyshyn, Tetiana Bubela, Mikołaj Skowron and Krzysztof Przystupa
Electronics 2025, 14(23), 4614; https://doi.org/10.3390/electronics14234614 - 24 Nov 2025
Viewed by 567
Abstract
A compact LED (light emission diode)-based illumination unit controlled by a microcontroller was developed for recombination-type silicon sensor structures. The system employs an 8 × 8 LED matrix that provides programmable spatial excitation patterns across a 2.2 × 2.2 mm sensor surface. Its [...] Read more.
A compact LED (light emission diode)-based illumination unit controlled by a microcontroller was developed for recombination-type silicon sensor structures. The system employs an 8 × 8 LED matrix that provides programmable spatial excitation patterns across a 2.2 × 2.2 mm sensor surface. Its operation is based on changes in the silicon surface recombination properties upon analyte interaction, producing photocurrent variations of 10–50 nA depending on the dipole moment. Compared with conventional laser-based systems, the proposed LED illumination significantly reduces cost, complexity, and power consumption while maintaining sufficient optical intensity for reliable photoresponse detection. The embedded controller enables precise timing, synchronization with the photocurrent acquisition unit, and flexible adaptation for various biological fluid analyses. This implementation demonstrates a scalable and cost-efficient alternative to stationary LBIC setups and supports integration into portable or IoT-compatible diagnostic systems. For comparative screening, the LED array was used instead of the focused laser beam typically employed in LBIC (laser beam-induced current) measurements. This paper substantially reduced the peak optical intensity at the sample surface, minimizing local thermal heating critical for enzyme-based or plasma samples sensitive to temperature fluctuations. Photocurrent mapping reveals charge-state modification of recombination centers at the SiOx/Si interface under optical excitation. Further optimization is expected for compact or simplified configurations, particularly those aimed at portable applications and automated physiological monitoring systems. Full article
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12 pages, 1513 KB  
Article
Impedance Spectroscopy for Interface Trap Effects Evaluation in Dopant-Free Silicon Solar Cells
by Ilaria Matacena, Laura Lancellotti, Eugenia Bobeico, Iurie Usatii, Marco della Noce, Elena Santoro, Pietro Scognamiglio, Lucia V. Mercaldo, Paola Delli Veneri and Santolo Daliento
Energies 2025, 18(17), 4558; https://doi.org/10.3390/en18174558 - 28 Aug 2025
Viewed by 911
Abstract
This work investigates the effect of interface traps on the impedance spectra of dopant-free silicon solar cells. The studied device consists of a crystalline silicon absorber with an a-Si:H/MoOx/ITO stack as the front passivating hole-collecting contact and an a-Si:H/LiF/Al stack as the rear [...] Read more.
This work investigates the effect of interface traps on the impedance spectra of dopant-free silicon solar cells. The studied device consists of a crystalline silicon absorber with an a-Si:H/MoOx/ITO stack as the front passivating hole-collecting contact and an a-Si:H/LiF/Al stack as the rear passivating electron-collecting contact. Experimental measurements, including illuminated current–voltage (I–V) characteristics and impedance spectroscopy, were performed on the fabricated devices and after a soft annealing treatment. The annealed cells exhibit an increased open-circuit voltage and a larger Nyquist plot radius. To interpret these results, a numerical model was developed in a TCAD environment. Simulations reveal that traps located at the p/i interface (MoOx/i-a-Si:H) significantly affect the impedance spectra, with higher trap concentrations leading to smaller Nyquist plot circumferences. The numerical impedance curves were aligned to the experimental data, enabling extraction of the interfacial traps concentration. The results highlight the sensitivity of impedance spectroscopy to interfacial quality and confirm that the performance improvement after soft annealing is primarily due to reduced defect density at the MoOx/i-a-Si:H interface. Full article
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14 pages, 2646 KB  
Article
Analog Resistive Switching Phenomena in Titanium Oxide Thin-Film Memristive Devices
by Karimul Islam, Rezwana Sultana and Robert Mroczyński
Materials 2025, 18(15), 3454; https://doi.org/10.3390/ma18153454 - 23 Jul 2025
Cited by 3 | Viewed by 1366
Abstract
Memristors with resistive switching capabilities are vital for information storage and brain-inspired computing, making them a key focus in current research. This study demonstrates non-volatile analog resistive switching behavior in Al/TiOx/TiN/Si(n++)/Al memristive devices. Analog resistive switching offers gradual, controllable [...] Read more.
Memristors with resistive switching capabilities are vital for information storage and brain-inspired computing, making them a key focus in current research. This study demonstrates non-volatile analog resistive switching behavior in Al/TiOx/TiN/Si(n++)/Al memristive devices. Analog resistive switching offers gradual, controllable conductance changes, which are essential for mimicking brain-like synaptic behavior, unlike digital/abrupt switching. The amorphous titanium oxide (TiOx) active layer was deposited using the pulsed-DC reactive magnetron sputtering technique. The impact of increasing the oxide thickness on the electrical performance of the memristors was investigated. Electrical characterizations revealed stable, forming-free analog resistive switching, achieving endurance beyond 300 DC cycles. The charge conduction mechanisms underlying the current–voltage (I–V) characteristics are analyzed in detail, revealing the presence of ohmic behavior, Schottky emission, and space-charge-limited conduction (SCLC). Experimental results indicate that increasing the TiOx film thickness from 31 to 44 nm leads to a notable change in the current conduction mechanism. The results confirm that the memristors have good stability (>1500 s) and are capable of exhibiting excellent long-term potentiation (LTP) and long-term depression (LTD) properties. The analog switching driven by oxygen vacancy-induced barrier modulation in the TiOx/TiN interface is explained in detail, supported by a proposed model. The remarkable switching characteristics exhibited by the TiOx-based memristive devices make them highly suitable for artificial synapse applications in neuromorphic computing systems. Full article
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12 pages, 4609 KB  
Article
Reduction of Interface State Density in 4H-SiC MOS Capacitors Modified by ALD-Deposited Interlayers
by Zhenyu Wang, Zhaopeng Bai, Yunduo Guo, Chengxi Ding, Qimin Huang, Lin Gu, Yi Shen, Qingchun Zhang and Hongping Ma
Nanomaterials 2025, 15(7), 555; https://doi.org/10.3390/nano15070555 - 5 Apr 2025
Cited by 3 | Viewed by 2041
Abstract
This study proposed an innovative method for growing gate oxide on silicon carbide (SiC), where silicon oxide (SiO2) was fabricated on a deposited Al2O3 layer, achieving high quality gate oxide. A thin Al2O3 passivation layer [...] Read more.
This study proposed an innovative method for growing gate oxide on silicon carbide (SiC), where silicon oxide (SiO2) was fabricated on a deposited Al2O3 layer, achieving high quality gate oxide. A thin Al2O3 passivation layer was deposited via atomic layer deposition (ALD), followed by Si deposition and reoxidation to fabricate a MOS structure. The effects of different ALD growth cycles on the interface chemical composition, trap density, breakdown characteristics, and bias stress stability of the MOS capacitors were systematically investigated. X-ray photoelectron spectroscopy (XPS) analyses revealed that an ALD Al2O3 passivation layer with 10 growth cycles effectively suppresses the formation of the proportion of Si-OxCy bonds. Additionally, the SiO2/Al2O3/SiC gate stack with 10 ALD growth cycles exhibited optimal electrical properties, including a minimum interface state density (Dit) value of 3 × 1011 cm−2 eV−1 and a breakdown field (Ebd) of 10.9 MV/cm. We also systematically analyzed the bias stress stability of the capacitors at room temperature and elevated temperatures. Analysis of flat-band voltage (ΔVfb) and midgap voltage (ΔVmg) hysteresis after high-temperature positive and negative bias stress demonstrated that incorporating a thin Al2O3 layer at the interface is the key factor in enhancing the stability of Vfb and midgap voltage Vmg. Full article
(This article belongs to the Section Nanoelectronics, Nanosensors and Devices)
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16 pages, 2805 KB  
Article
Numerical Investigation of Perovskite/Silicon Heterojunction Tandem Solar Cell with a Dual-Functional Layer of MoOX
by Tian-Yu Lu, Jin Wang and Xiao-Dong Feng
Materials 2025, 18(7), 1438; https://doi.org/10.3390/ma18071438 - 24 Mar 2025
Cited by 1 | Viewed by 1406
Abstract
This study proposed a novel perovskite/silicon heterojunction (SHJ) tandem device structure without an interlayer, represented as ITO/NiO/perovskite/SnO2/MoOX/i-a-Si:H/n-c-Si/i-a-Si:H/n-a-Si:H/Ag, which was investigated by Silvaco TCAD software. The recombination layer in this structure comprises the carrier transport layers of SnO2 and [...] Read more.
This study proposed a novel perovskite/silicon heterojunction (SHJ) tandem device structure without an interlayer, represented as ITO/NiO/perovskite/SnO2/MoOX/i-a-Si:H/n-c-Si/i-a-Si:H/n-a-Si:H/Ag, which was investigated by Silvaco TCAD software. The recombination layer in this structure comprises the carrier transport layers of SnO2 and MoOX, where MoOX serves dual functions, acting as the emitter for the SHJ bottom cell and as part of the recombination layer in the tandem cell. First, the effects of different recombination layers are analyzed, and the SnO2/MoOX layer demonstrates the best performance. Then, we systematically investigated the impact of the carrier concentration, interface defect density, thicknesses of the SnO2/MoOX layer, different hole transport layers (HTLs) for the top cell, absorption layer thicknesses, and perovskite defect density on device performance. The optimal carrier concentration in the recombination layer should exceed 5 × 1019 cm−3, the interface defect density should be below 1 × 1016 cm−2, and the thicknesses of SnO2/MoOX should be kept at 20 nm/20 nm. CuSCN has been found to be the optimal HTL for the top cell. When the silicon absorption layer is 200 μm, the perovskite layer thickness is 470 nm, and the defect density of the perovskite layer is 1011 cm−3, the planar structure can achieve the best performance of 32.56%. Finally, we studied the effect of surface texturing on the SHJ bottom cell, achieving a power conversion efficiency of 35.31% for the tandem cell. Our simulation results suggest that the simplified perovskite/SHJ tandem solar cell with a dual-functional MoOX layer has the potential to provide a viable pathway for developing high-efficiency tandem devices. Full article
(This article belongs to the Special Issue Recent Advances in Semiconductors for Solar Cell Devices)
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10 pages, 2781 KB  
Article
Interface and Size Effects of Amorphous Si/Amorphous Silicon Oxynitride Multilayer Structures on the Photoluminescence Spectrum
by Chao Song, Jie Song and Xiang Wang
Coatings 2024, 14(8), 977; https://doi.org/10.3390/coatings14080977 - 2 Aug 2024
Cited by 2 | Viewed by 1802
Abstract
A room-temperature photoluminescence (PL) study of amorphous Si/amorphous silicon oxynitride multilayer films prepared by plasma-enhanced chemical vapor deposition is reported. The PL peak position can be tuned from 800 nm to 660 nm by adjusting the oxygen/nitride ratio in the a-SiOxN [...] Read more.
A room-temperature photoluminescence (PL) study of amorphous Si/amorphous silicon oxynitride multilayer films prepared by plasma-enhanced chemical vapor deposition is reported. The PL peak position can be tuned from 800 nm to 660 nm by adjusting the oxygen/nitride ratio in the a-SiOxNy:H sublayer. The Fourier transform infrared (FTIR) absorption spectra indicate that the shift of the PL peak position is accompanied by an increase in the Si-O-Si absorption peak’s intensity, which induces the structural disorder at the interface, resulting in an increase in band gap energy. The effects of size on the photoluminescence spectrum have been studied. As a result, it has been observed that the addition of oxygen atoms introduces a large number of localized states at the interface, causing a blue shift in the emission peak position. With an increase in oxygen atoms, the localized states tend to saturate, and the quantum phenomenon caused by the a-Si sublayer becomes more pronounced. It is found that, as the thickness of the a-Si sublayer decreases, the increase in the [O/N] ratio is more likely to cause an increase in disordered states, leading to a decrease in luminescence intensity. For a-Si/a-SiOxNy:H samples with thinner a-Si sublayers, an appropriate value of [O/N] is required to achieve luminescence enhancement. When the value of [O/N] is one, the enhanced luminescence is obtained. It is also suggested that the PL originates from the radiative recombination in the localized states’ T3- level-related negatively charged silicon dangling bond in the band tail of the a-Si:H sublayer embedded in an a-Si/a-SiOxNy:H multilayer structure. Full article
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13 pages, 3466 KB  
Article
Supported Inverse MnOx/Pt Catalysts Facilitate Reverse Water Gas Shift Reaction
by Wenli Bi, Ruoyu Zhang, Qingfeng Ge and Xinli Zhu
Catalysts 2024, 14(7), 456; https://doi.org/10.3390/catal14070456 - 16 Jul 2024
Cited by 7 | Viewed by 2447
Abstract
Catalytic conversion of CO2 to CO via the reverse water gas shift (RWGS) reaction has been identified as a promising approach for CO2 utilization and mitigation of CO2 emissions. Bare Pt shows low activity for the RWGS reaction due to [...] Read more.
Catalytic conversion of CO2 to CO via the reverse water gas shift (RWGS) reaction has been identified as a promising approach for CO2 utilization and mitigation of CO2 emissions. Bare Pt shows low activity for the RWGS reaction due to its low oxophilicity, with few research works having concentrated on the inverse metal oxide/Pt catalyst for the RWGS reaction. In this work, MnOx was deposited on the Pt surface over a SiO2 support to prepare the MnOx/Pt inverse catalyst via a co-impregnation method. Addition of 0.5 wt% Mn to 1 wt% Pt/SiO2 improved the intrinsic reaction rate and turnover frequency at 400 °C by two and twelve times, respectively. Characterizations indicate that MnOx partially encapsulates the surface of the Pt particles and the coverage increases with increasing Mn content, which resembles the concept of strong metal–support interaction (SMSI). Although the surface accessible Pt sites are reduced, new MnOx/Pt interfacial perimeter sites are created, which provide both hydrogenation and C-O activation functionalities synergistically due to the close proximity between Pt and MnOx at the interface, and therefore improve the activity. Moreover, the stability is also significantly improved due to the coverage of Pt by MnOx. This work demonstrates a simple method to tune the oxide/metal interfacial sites of inverse Pt-based catalyst for the RWGS reaction. Full article
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11 pages, 1309 KB  
Article
Formation of Organic Monolayers on KF-Etched Si Surfaces
by Tiexin Li, Zane Datson and Nadim Darwish
Surfaces 2024, 7(2), 358-368; https://doi.org/10.3390/surfaces7020022 - 10 May 2024
Cited by 2 | Viewed by 1967
Abstract
Silicon is the most commonly used material in the microelectronics industry, due to its inherent advantages of high natural abundance, low cost, and high purity, coupled with the chemical and electrical stability at the interface with its oxide. For molecular electronics applications, oxide-free [...] Read more.
Silicon is the most commonly used material in the microelectronics industry, due to its inherent advantages of high natural abundance, low cost, and high purity, coupled with the chemical and electrical stability at the interface with its oxide. For molecular electronics applications, oxide-free Si surfaces are widely used because of the relative ease of removing the oxide (SiOx) by chemical means, yielding a surface which forms strong covalent bonds with a wide range of chemical functional groups; another advantage is that these surfaces remain oxide-free in the absence of oxidising agents. Standard procedures require the use of either HF, NH4F, or a mixture of both as the etching solution; however, these two chemicals are highly corrosive and toxic, posing a significant risk to the experimentalist. Here, we report that for silicon wafers etched by using potassium fluoride, a less toxic chemical, the resulting surface is free of oxides and can be functionalized by self-assembled monolayers of 1,8-nonadiyne. To demonstrate this, Si/SiOx wafers were etched by using either KF or NH4F, followed by hydrosilylation with 1,8-nonadiyne and a click reaction of the terminal alkyne with azidomethylferrocene. The surface coverages and electron transfer kinetics of the ferrocene-terminated KF-etched surfaces are comparable to those formed by acidic fluoride etching procedures. This is the first study comparing the differences between surfaces functionalized by self-assembled monolayers of 1,8-nonadiyne which were etched by KF and NH4F. KF could be used as a replacement chemical for etching silicon wafers when a less corrosive and toxic chemical is required. Full article
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14 pages, 5603 KB  
Article
Effect of Interfacial Oxide Layers on Self-Doped PEDOT/Si Hybrid Solar Cells
by Aditya Saha, Ryuji Oshima, Daisuke Ohori, Takahiko Sasaki, Hirokazu Yano, Hidenori Okuzaki, Takashi Tokumasu, Kazuhiko Endo and Seiji Samukawa
Energies 2023, 16(19), 6900; https://doi.org/10.3390/en16196900 - 30 Sep 2023
Cited by 1 | Viewed by 2362
Abstract
PEDOT:PSS/Si hybrid photovoltaic cells have been attracting attention as a potential way to simplify the manufacturing process and democratize solar energy production. Control of the PEDOT/Si interface is also one of the primary ways to ensure the improved performance and lifetimes of multijunction [...] Read more.
PEDOT:PSS/Si hybrid photovoltaic cells have been attracting attention as a potential way to simplify the manufacturing process and democratize solar energy production. Control of the PEDOT/Si interface is also one of the primary ways to ensure the improved performance and lifetimes of multijunction devices, such as perovskite/Si tandem solar cells. In this work, the effects of the interfacial silicon oxide layer were investigated by creating a novel and controllable neutral beam oxide interlayer with different thicknesses. A novel self-doped PEDOT (S-PEDOT) was used to improve interfacial contact and avoid the secondary doping of PEDOT:PSS. X-ray photoelectron spectroscopy (XPS) showed that the saturation of interfacial silicon atoms in SiOx-Si bonds as well as a very thin, (~1 nm) damage-free oxide interlayer were the keys to maintaining good passivation with a high tunneling current. Lifetime measurements also showed that the interlayers with the most SiO2 content degraded the least. The degradation of the devices was due to the continued growth of the oxide layer through reactions with silicon sub-oxides and the degradation of S-PEDOT. Full article
(This article belongs to the Special Issue Emerging Technologies for Multijunction Solar Cells)
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13 pages, 3724 KB  
Article
Passivating Silicon Tunnel Diode for Perovskite on Silicon Nip Tandem Solar Cells
by Baptiste Marteau, Thibaut Desrues, Quentin Rafhay, Anne Kaminski and Sébastien Dubois
Energies 2023, 16(11), 4346; https://doi.org/10.3390/en16114346 - 26 May 2023
Cited by 5 | Viewed by 2655
Abstract
Silicon solar cells featuring tunnel oxide passivated contacts (TOPCon) benefit from high efficiencies and low production costs and are on the verge of emerging as the new photovoltaic market mainstream technology. Their association with Perovskite cells in 2-terminal tandem devices enables efficiency breakthroughs [...] Read more.
Silicon solar cells featuring tunnel oxide passivated contacts (TOPCon) benefit from high efficiencies and low production costs and are on the verge of emerging as the new photovoltaic market mainstream technology. Their association with Perovskite cells in 2-terminal tandem devices enables efficiency breakthroughs while maintaining low fabrication costs. However, it requires the design of a highly specific interface to ensure both optical and electrical continuities between subcells. Here, we evaluated the potential of tunnel diodes as an alternative to ITO thin films, the reference for such applications. The PECV deposition of an nc-Si (n+) layer on top of a boron-doped poly-Si/SiOx passivated contact forms a diode with high doping levels (>2 × 1020 carrier·cm−3) and a sharp junction (<4 nm), thus reaching both ESAKI-like tunnel diode requirements. SIMS measurements of the nc-Si (n+) (deposited at 230 °C) reveal an H-rich layer. Interestingly, subsequent annealing at 400 °C led to a passivation improvement associated with the hydrogenation of the buried poly-Si/SiOx stack. Dark I–V measurements reveal similar characteristics for resistivity samples with or without the nc-Si (n+) layer, and modeling results confirm that highly conductive junctions are obtained. Finally, we produced 9 cm2 nip perovskite on silicon tandem devices, integrating a tunnel diode as the recombination junction between both subcells. Working devices with 18.8% average efficiency were obtained, with only 1.1%abs PCE losses compared with those of references. Thus, tunnel diodes appear to be an efficient, industrially suitable, and indium-free alternative to ITO thin films. Full article
(This article belongs to the Special Issue Recent Development of Silicon Solar Cells)
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9 pages, 4562 KB  
Communication
A Theoretical Sub-0.1 dB Loss Single Mode Fiber-To-Chip Edge Coupler for Silicon Nitride Waveguides
by Di Wu, Wei Yan, Yucong Yang, Xiaoyi Song, Zixuan Wei, Jun Qin, Longjiang Deng and Lei Bi
Photonics 2023, 10(3), 231; https://doi.org/10.3390/photonics10030231 - 21 Feb 2023
Cited by 8 | Viewed by 7855
Abstract
A low loss optical interconnection between optical fibers and photonic integrated circuits is critical for high performance photonic systems. In the past decade, spot size converters, subwavelength waveguide grating (SWG) structures, and different refractive index materials have been applied to allow efficient coupling [...] Read more.
A low loss optical interconnection between optical fibers and photonic integrated circuits is critical for high performance photonic systems. In the past decade, spot size converters, subwavelength waveguide grating (SWG) structures, and different refractive index materials have been applied to allow efficient coupling between the fiber and the photonic chips. However, it is still challenging to achieve low-loss coupling when interfacing high index contrast waveguides such as SiN with SMF-28 fibers. In this work, we report a multilayer edge-coupler using SiOxN materials with different indices to allow for efficient edge coupling between SMF-28 fiber and SiN single mode waveguides. A coupling loss of 0.068 dB for the TM mode was achieved theoretically at a 1550 nm wavelength, with a 1 dB alignment tolerance offset of 2.4 μm. Full article
(This article belongs to the Section Optoelectronics and Optical Materials)
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13 pages, 4208 KB  
Article
Stoichiometry and Morphology Analysis of Thermally Deposited V2O5−x Thin Films for Si/V2O5−x Heterojunction Solar Cell Applications
by Gwan Seung Jeong, Yoon-Chae Jung, Na Yeon Park, Young-Jin Yu, Jin Hee Lee, Jung Hwa Seo and Jea-Young Choi
Materials 2022, 15(15), 5243; https://doi.org/10.3390/ma15155243 - 29 Jul 2022
Cited by 5 | Viewed by 2276
Abstract
In recent decades, dopant-free Si-based solar cells with a transition metal oxide layer have gained noticeable research interest as promising candidates for next-generation solar cells with both low manufacturing cost and high power conversion efficiency. Here, we report the effect of the substrate [...] Read more.
In recent decades, dopant-free Si-based solar cells with a transition metal oxide layer have gained noticeable research interest as promising candidates for next-generation solar cells with both low manufacturing cost and high power conversion efficiency. Here, we report the effect of the substrate temperature for the deposition of vanadium oxide (V2O5−x, 0 ≤ X ≤ 5) thin films (TFs) for enhanced Si surface passivation. The effectiveness of SiOx formation at the Si/V2O5−x interface for Si surface passivation was investigated by comparing the results of minority carrier lifetime measurements, X-ray photoelectron spectroscopy, and atomic force microscopy. We successfully demonstrated that the deposition temperature of V2O5−x has a decisive effect on the surface passivation performance. The results confirmed that the aspect ratio of the V2O5−x islands that are initially deposited is a crucial factor to facilitate the transport of oxygen atoms originating from the V2O5−x being deposited to the Si surface. In addition, the stoichiometry of V2O5−x TFs can be notably altered by substrate temperature during deposition. As a result, experimentation with the fabricated Si/V2O5−x heterojunction solar cells confirmed that the power conversion efficiency is the highest at a V2O5−x deposition temperature of 75 °C. Full article
(This article belongs to the Special Issue Advanced Properties of Engineering Thin Films and Materials)
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10 pages, 2811 KB  
Article
Vacuum and Low-Temperature Characteristics of Silicon Oxynitride-Based Bipolar RRAM
by Nayan C. Das, Minjae Kim, Sung-Min Hong and Jae-Hyung Jang
Micromachines 2022, 13(4), 604; https://doi.org/10.3390/mi13040604 - 12 Apr 2022
Cited by 5 | Viewed by 3368
Abstract
This study investigates the switching characteristics of the silicon oxynitride (SiOxNy)-based bipolar resistive random-access memory (RRAM) devices at different operating ambiances at temperatures ranging from 300 K to 77 K. The operating ambiances (open air or vacuum) and temperature [...] Read more.
This study investigates the switching characteristics of the silicon oxynitride (SiOxNy)-based bipolar resistive random-access memory (RRAM) devices at different operating ambiances at temperatures ranging from 300 K to 77 K. The operating ambiances (open air or vacuum) and temperature affect the device’s performance. The electroforming-free multilevel bipolar Au/Ni/SiOxNy/p+-Si RRAM device (in open-air) becomes bilevel in a vacuum with an on/off ratio >104 and promising data retention properties. The device becomes more resistive with cryogenic temperatures. The experimental results indicate that the presence and absence of moisture (hydrogen and hydroxyl groups) in open air and vacuum, respectively, alter the elemental composition of the amorphous SiOxNy active layer and Ni/SiOxNy interface region. Consequently, this affects the overall device performance. Filament-type resistive switching and trap-controlled space charge limited conduction (SCLC) mechanisms in the bulk SiOxNy layer are confirmed. Full article
(This article belongs to the Special Issue Advances in Emerging Nonvolatile Memory)
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14 pages, 39429 KB  
Article
Directional Growth of cm-Long PLGA Nanofibers by a Simple and Fast Wet-Processing Method
by Erik Betz-Güttner, Martina Righi, Silvestro Micera and Alessandro Fraleoni-Morgera
Materials 2022, 15(2), 687; https://doi.org/10.3390/ma15020687 - 17 Jan 2022
Cited by 3 | Viewed by 3083
Abstract
The development of aligned nanofibers as useful scaffolds for tissue engineering is an actively sought-for research objective. Here, we propose a novel improvement of an existing self-assembly-based nanofabrication technique (ASB-SANS). This improvement, which we termed Directional ASB-SANS, allows one to produce cm2 [...] Read more.
The development of aligned nanofibers as useful scaffolds for tissue engineering is an actively sought-for research objective. Here, we propose a novel improvement of an existing self-assembly-based nanofabrication technique (ASB-SANS). This improvement, which we termed Directional ASB-SANS, allows one to produce cm2-large domains of highly aligned poly(lactic-co-glycolic acid) (PLGA) nanofibers in a rapid, inexpensive, and easy way. The so-grown aligned PLGA nanofibers exhibited remarkable adhesion to different substrates (glass, polyimide, and Si/SiOx), even when immersed in PBS solution and kept at physiological temperature (37 °C) for up to two weeks. Finally, the Directional ASB-SANS technique allowed us to grow PLGA fibers also on highly heterogeneous substrates such as polyimide-based, gold-coated flexible electrodes. These results suggest the viability of Directional ASB-SANS method for realizing biocompatible/bioresorbable, nanostructured coatings, potentially suitable for neural interface systems. Full article
(This article belongs to the Special Issue Organic Nanofibers: Fabrication, Properties and Applications)
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