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Recent Advances in Machine learning and Deep Learning Theories: Towards Intelligent Fault Diagnosis

This special issue belongs to the section “E1: Mathematics and Computer Science“.

Special Issue Information

Dear Colleagues,

Machines and mechanical structures undergo various faults during operation. The timely diagnosis of these faults and the prediction of their future health condition is essential for industrial productivity and reliability. Recently, intelligent fault diagnosis (IFD) has attracted much attention due to its promising ability to automatically recognize the health state of machines. Intelligent fault diagnosis (IFD) refers to applications of machine learning theories, such as artificial neural networks (ANN), support vector machine (SVM), and deep neural networks (DNN), to machine fault diagnosis. In the past, traditional machine learning (ML) theories began to reduce the contribution of human labor and brought forth the era of artificial intelligence to machine fault diagnosis. In recent years, the advent of deep learning (DL) theories has reformed IFD by further releasing artificial assistance that encouraged the development of an end-to-end diagnosis process.

The purpose of this Special Issue is to provide a research-publishing environment for articles with the latest developments in ML and DL approaches for real-world applications in intelligent fault diagnosis. We invite researchers and practicing engineers to contribute original research articles that discuss issues related but not limited to:

  1. Diagnostic and prognostic techniques based on AI;
  2. Data-driven and model-based sensor fault diagnosis;
  3. Feature construction with intelligent algorithms;
  4. Data augmentation techniques for fault diagnosis;
  5. AI-based solutions that are explainable;
  6. Machine-to-machine interfaces and paradigms for fault diagnosis and prognosis in the context of Industry 4.0.

We also welcome review articles that capture the current state of the art and outline future areas of research in the fields relevant to this Special Issue.

Prof. Dr. Heung Soo Kim
Prof. Dr. Salman Khalid
Dr. Ananda Shankar
Dr. Prashant Kumar
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Mathematics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • industrial systems
  • smart industry
  • fault diagnosis
  • deep neural networks
  • convolutional neural networks
  • intelligent machines
  • feature extraction and analysis
  • machine learning and deep learning algorithms
  • classification and clustering
  • pattern recognition
  • probabilistic and statistical methods

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Mathematics - ISSN 2227-7390