Recent Advancements in X-ray Imaging
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: 20 January 2026 | Viewed by 23
Special Issue Editors
Interests: ultrafast fluctuations; quantum materials; imaging strain; nanomaterials; materials properties; device functionalities
Special Issues, Collections and Topics in MDPI journals
Interests: ultrafast lasers; nonlinear optics; high harmonic generation; XUV microscopy and spectroscopy; laser based X-ray sources
Special Issue Information
Dear Colleagues,
The advent of intense light sources, such as fourth-generation synchrotrons and revolutionary tools like X-ray Free Electron Lasers (XFELs), has profoundly transformed our ability to probe matter at unprecedented resolutions. These facilities enable nanoscale spatial resolution and temporal precision on the femtosecond scale, allowing for researchers to observe phenomena on the timescale of atomic motions. Beyond their extraordinary light sources, the instrumentation at these facilities has evolved to deliver physical information on every dimension with exceptional resolution, pushing the boundaries of what is experimentally achievable.
Recent advances in X-ray imaging techniques are unlocking new ways to explore the properties of materials. For instance, the combination of ptychography with X-ray Circular Magnetic Dichroism (XMCD) imaging has opened new avenues for understanding the interplay between physical, chemical, and magnetic properties in three-dimensional nanostructures. Similarly, approaches such as Fourier Transform Holography (FTH) and Coherent Diffraction Imaging (CDI), when integrated into hyperspectral imaging frameworks, have enabled researchers to visualize topological dynamics in quantum materials. These examples highlight the transformative potential of modern X-ray techniques in elucidating complex material behaviors.
This Special Issue seeks to spotlight the latest advances in X-ray imaging methods, including high-phase-contrast imaging, tomography, topography, coherent diffraction imaging, and their diverse applications in materials science. These applications span a broad spectrum, encompassing soft, condensed, biological, nanostructured, and quantum materials, as well as their synthesis. Additionally, we encourage contributions that explore innovations in X-ray technology, optics, and instrumentation, which continue to enhance the scope and capabilities of these techniques.
Dr. Nicolas Burdet
Prof. Dr. Christian Spielmann
Guest Editors
Manuscript Submission Information
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Keywords
- X-ray imaging
- materials science
- X-ray technology
- X-ray Free Electron Lasers
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