Optical Measurement: Advanced Techniques and Applications
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: 30 April 2026 | Viewed by 16
Special Issue Editor
Special Issue Information
Dear Colleagues,
Optical measurement provides non-contact, high-resolution, and real-time characterization tools that are essential across science, engineering, and industry. Established techniques such as interferometry, deflectometry, fringe projection profilometry, and Talbot interferometry continue to advance, offering powerful solutions for precision metrology, surface inspection, and 3D reconstruction. Recent developments include dynamic interferometry for time-resolved analysis, continuous frequency scanning interferometry for robust large-scale metrology, and novel strategies for the metrology of freeform optical surfaces. Equally important are advances in phase retrieval and phase unwrapping, which remain central to extracting quantitative information from fringe and interferometric data.
The integration of artificial intelligence (AI) and machine learning is reshaping optical metrology, enabling fringe denoising, phase unwrapping, real-time reconstruction, and adaptive measurement strategies. These innovations expand the scope of optical measurement to include increasingly complex, dynamic, and industrially relevant scenarios.
This Special Issue welcomes contributions on theoretical advances in, experimental demonstrations of, and applications of advanced optical metrology.
Topics of interest include (but are not limited to) the following:
- Interferometry, dynamic interferometry, and frequency-scanning interferometry for continuous/dynamic measurement;
- Deflectometry and slope-based optical testing;
- Fringe projection profilometry for 3D analysis;
- Talbot interferometry and self-imaging wavefront sensing;
- Metrology of freeform and aspheric optical surfaces;
- Phase retrieval and unwrapping algorithms under noisy or dynamic conditions;
- Artificial intelligence and machine learning applications in optical measurement—denoising, adaptive systems, and real-time reconstruction;
- Industrial, biomedical, and manufacturing applications of advanced optical measurement.
Dr. Jorge L. Flores
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- interferometry
- optical profilometry
- deflectometry
- phase retrieval
- denoising
- machine learning
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- Reprint: MDPI Books provides the opportunity to republish successful Special Issues in book format, both online and in print.
Further information on MDPI's Special Issue policies can be found here.
