Radiation and Environmental Effects on Electronic Devices: Reliability, Failure, and Protection
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".
Deadline for manuscript submissions: 30 November 2025 | Viewed by 9
Special Issue Editor
Interests: reliability physics; reliability statistics; system reliability
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In today’s advanced technological landscape, electronic devices are being deployed in increasingly harsh environments—from outer space to high-altitude aviation, nuclear facilities, the automotive sector, and various industrial zones. Radiation and environmental stressors, such as temperature extremes, humidity, mechanical shock, and ionizing radiation, pose serious threats to device reliability.
Exposure to these factors can cause the degradation of materials, transient faults, or permanent failures in microelectronic circuits. Radiation may induce single-event upsets (SEUs), latch-up, total ionizing dose (TID) effects or displacement damage (DD), potentially compromising mission-critical systems.
To ensure the long-term performance and safety of electronic systems, it is essential to understand the failure mechanisms generated by these stressors, mitigation techniques and protective design strategies, and robust testing standards to validate their reliability under extreme conditions.
This Special Issue seeks manuscripts that address the abovementioned challenges, helping engineers design electronics that withstand even the most unforgiving environments—extending operational life, ensuring functional safety, and preserving data integrity.
Prof. Dr. Cher Ming Tan
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- degradation
- safety
- testing
- mission-critical electronic systems
- failure analysis
- mitigation
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- Reprint: MDPI Books provides the opportunity to republish successful Special Issues in book format, both online and in print.
Further information on MDPI's Special Issue policies can be found here.
