Scope (new version):

Scope (old version):

The name Metrology hints that the journal’s focus is on the formal definition of metrology—“metrology is the science of measurement and its application” [1]—where it is noted that metrology includes all theoretical and practical aspects of measurement, regardless of what the measurement uncertainty and field of application may be. This broad scope does not imply that any modeled or physical measurement can be published in Metrology; rather, the journal is concerned with innovative concepts, new perspectives, and illustrations of applications from which other readers can benefit, operating beyond the traditional boundaries between metrology fields. Basic metrological concepts such as uncertainty evaluation and traceability to the seven base units of the International System of Units and the derived units are the natural background and requirement for all contributions.

Metrology covers a broad range of areas, such as studies related to the following topics:

The name Metrology hints that the journal’s focus is on the formal definition of metrology “metrology is the science of measurement and its application” [1]—where it is noted that metrology includes all theoretical and practical aspects of measurement, regardless of what the measurement uncertainty and field of application may be. This broad scope does not imply that any modeled or physical measurement can be published in Metrology; rather, the journal is concerned with innovative concepts, new perspectives, and illustrations of applications from which other readers can benefit, operating beyond the traditional boundaries between metrology fields. Basic metrological concepts such as uncertainty evaluation and traceability to the seven base units of the International System of Units are the natural background and requirement for all contributions.

Metrology covers a broad range of areas, such as studies related to the following topics:

• Traceability to SI units of complex measurement systems;

• Traceability to SI units of complex measurement systems;

• Measurement theory in a broad context;

• Measurement theory in a broad context;

• Measurement uncertainty and uncertainty evaluation;

• Measurement uncertainty and uncertainty evaluation;

• Considerations on the fundamentals of measurement;

• Considerations on the fundamentals of measurement;

• Error separation methods;

• Error separation methods;

• Novel methods inspired by the redefinition of the SI;

• Novel methods inspired by the redefinition of the SI;

• Artificial intelligence, especially its effect on traceability;

• Cyberphysical systems;

• Machine learning for metrology;

• Artificial intelligence, especially its effect on traceability;

• Precision measurement;

• Machine learning for metrology;

• Digital twins;

• Precision measurement;

• Metrology for sustainable manufacturing;

• Digital twins;

• Precision manufacturing;

• Metrology for sustainable manufacturing;

• Measurement techniques and devices;

• Precision manufacturing;

• Interferometry;

• Measurement techniques and devices;

• XCT measurements;

• Interferometry;

• Three-dimensional metrology;

• XCT measurements;

• Frequency metrology;

• 3D metrology;

• Surface metrology;

• Frequency metrology;

• Biomedical measurement;

• Surface metrology;

• Virtual measurement;

• Biomedical measurement;

• Power measurement;

• Virtual measurement;

• Sensor calibration.

• Power measurement.

[1] International vocabulary of metrology – Basic and general concepts and associated terms, 2012, Joint Committee for Guides in Metrology (JCGM). Available Online: https://www.bipm.org/documents/20126/2071204/JCGM_200_2012.pdf/f0e1ad45-d337-bbeb-53a6-15fe649d0ff1 (accessed on 12 October 2021)

[1] International vocabulary of metrology – Basic and general concepts and associated terms, 2012, Joint Committee for Guides in Metrology (JCGM). Available Online: https://www.bipm.org/documents/20126/2071204/JCGM_200_2012.pdf/f0e1ad45-d337-bbeb-53a6-15fe649d0ff1 (accessed on 12 October 2021)