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Volume 4
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10.3390/chips4010012
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Review

Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts

by
Vitor A. P. Aguiar
*,†,
Saulo G. Alberton
*,† and
Matheus S. Pereira
†
Institute of Physics, University of Sao Paulo-Rua do Matão, Sao Paulo 1387, Brazil
*
Authors to whom correspondence should be addressed.
†
These authors contributed equally to this work.
Chips 2025, 4(1), 12; https://doi.org/10.3390/chips4010012
Submission received: 11 February 2025 / Revised: 12 March 2025 / Accepted: 14 March 2025 / Published: 18 March 2025
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Abstract

Radiation effects on electronic devices represent a major concern in applications for harsh environments, such as aerospace and nuclear facilities. This article presents a review of fundamental aspects of radiation effects on semiconductors, with a primary focus on Single-Event Effects. It discusses charge collection models, destructive effects, applications in detectors, and impacts on digital devices, drawing from recent research findings.
Keywords: radiation effects; single-event effects; semiconductor devices; digital electronics; power electronics; reliability; electron devices radiation effects; single-event effects; semiconductor devices; digital electronics; power electronics; reliability; electron devices

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MDPI and ACS Style

Aguiar, V.A.P.; Alberton, S.G.; Pereira, M.S. Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts. Chips 2025, 4, 12. https://doi.org/10.3390/chips4010012

AMA Style

Aguiar VAP, Alberton SG, Pereira MS. Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts. Chips. 2025; 4(1):12. https://doi.org/10.3390/chips4010012

Chicago/Turabian Style

Aguiar, Vitor A. P., Saulo G. Alberton, and Matheus S. Pereira. 2025. "Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts" Chips 4, no. 1: 12. https://doi.org/10.3390/chips4010012

APA Style

Aguiar, V. A. P., Alberton, S. G., & Pereira, M. S. (2025). Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts. Chips, 4(1), 12. https://doi.org/10.3390/chips4010012

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