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Journal: Chips, 2025
Volume: 4
Number: 12

Article: Radiation-Induced Effects on Semiconductor Devices: A Brief Review on Single-Event Effects, Their Dynamics, and Reliability Impacts
Authors: by Vitor A. P. Aguiar, Saulo G. Alberton and Matheus S. Pereira
Link: https://www.mdpi.com/2674-0729/4/1/12

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