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Journal: Metrology, 2026
Volume: 6
Number: 30

Article: Interferometric Surface Profile Measurement Based on Radial Polarization and Wavelength Variation
Authors: by Yen-Chang Chu, Wei-En Bi, Jing-Heng Chen and Kun-Huang Chen
Link: https://www.mdpi.com/2673-8244/6/2/30

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