Zeier, M.; Wollensack, M.; Hoffmann, J.; Morrissey, P.; Ruefenacht, J.; Stalder, D.
VNA Tools—A Metrology Software Supporting the Digital Traceability Chain. Metrology 2025, 5, 72.
https://doi.org/10.3390/metrology5040072
AMA Style
Zeier M, Wollensack M, Hoffmann J, Morrissey P, Ruefenacht J, Stalder D.
VNA Tools—A Metrology Software Supporting the Digital Traceability Chain. Metrology. 2025; 5(4):72.
https://doi.org/10.3390/metrology5040072
Chicago/Turabian Style
Zeier, Markus, Michael Wollensack, Johannes Hoffmann, Peter Morrissey, Juerg Ruefenacht, and Daniel Stalder.
2025. "VNA Tools—A Metrology Software Supporting the Digital Traceability Chain" Metrology 5, no. 4: 72.
https://doi.org/10.3390/metrology5040072
APA Style
Zeier, M., Wollensack, M., Hoffmann, J., Morrissey, P., Ruefenacht, J., & Stalder, D.
(2025). VNA Tools—A Metrology Software Supporting the Digital Traceability Chain. Metrology, 5(4), 72.
https://doi.org/10.3390/metrology5040072