Rosenzweig, J.B.; Andonian, G.; Agustsson, R.; Anisimov, P.M.; Araujo, A.; Bosco, F.; Carillo, M.; Chiadroni, E.; Giannessi, L.; Huang, Z.;
et al. A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments 2024, 8, 19.
https://doi.org/10.3390/instruments8010019
AMA Style
Rosenzweig JB, Andonian G, Agustsson R, Anisimov PM, Araujo A, Bosco F, Carillo M, Chiadroni E, Giannessi L, Huang Z,
et al. A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments. 2024; 8(1):19.
https://doi.org/10.3390/instruments8010019
Chicago/Turabian Style
Rosenzweig, James B., Gerard Andonian, Ronald Agustsson, Petr M. Anisimov, Aurora Araujo, Fabio Bosco, Martina Carillo, Enrica Chiadroni, Luca Giannessi, Zhirong Huang,
and et al. 2024. "A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs" Instruments 8, no. 1: 19.
https://doi.org/10.3390/instruments8010019
APA Style
Rosenzweig, J. B., Andonian, G., Agustsson, R., Anisimov, P. M., Araujo, A., Bosco, F., Carillo, M., Chiadroni, E., Giannessi, L., Huang, Z., Fukasawa, A., Kim, D., Kutsaev, S., Lawler, G., Li, Z., Majernik, N., Manwani, P., Maxson, J., Miao, J.,
... Yadav, M.
(2024). A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs. Instruments, 8(1), 19.
https://doi.org/10.3390/instruments8010019