Lee, C.-Y.; Shieh, J.-S.; Huang, G.-Q.; Liu, C.-K.; Cox, N.; Chou, C.-H.
Enhancing the Reliability and Durability of Micro-Sensors Using the Taguchi Method. Processes 2025, 13, 2852.
https://doi.org/10.3390/pr13092852
AMA Style
Lee C-Y, Shieh J-S, Huang G-Q, Liu C-K, Cox N, Chou C-H.
Enhancing the Reliability and Durability of Micro-Sensors Using the Taguchi Method. Processes. 2025; 13(9):2852.
https://doi.org/10.3390/pr13092852
Chicago/Turabian Style
Lee, Chi-Yuan, Jiann-Shing Shieh, Guan-Quan Huang, Chen-Kai Liu, Najsm Cox, and Chia-Hao Chou.
2025. "Enhancing the Reliability and Durability of Micro-Sensors Using the Taguchi Method" Processes 13, no. 9: 2852.
https://doi.org/10.3390/pr13092852
APA Style
Lee, C.-Y., Shieh, J.-S., Huang, G.-Q., Liu, C.-K., Cox, N., & Chou, C.-H.
(2025). Enhancing the Reliability and Durability of Micro-Sensors Using the Taguchi Method. Processes, 13(9), 2852.
https://doi.org/10.3390/pr13092852